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Lee, Y.-L., Tsung, P.-K., & Wu, M. 2018, Techology trend of edge ai. Paper presented at 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT).  
12/08/2020, 09:15
WIKINDX 6.7.0 | Total resources: 1621 | Username: -- | Bibliography: WIKINDX Master Bibliography | Style: American Psychological Association (APA)